1.
Diffusion Phenomena in Thin Films and Microelectronic Materials
by Gupta, Devendra, Ho, Paul S.
ISBN: 9780815511670
List Price: $139.00
2.
Low Dielectric Constant Materials for IC Applications
by Ho, Paul S., Leu, Jihperng,...
ISBN: 9783642632211
List Price: $199.00
3.
Advanced Interconnects for ULSI Technology
by Baklanov, Mikhail, Ho, Paul...
ISBN: 9780470662540
List Price: $205.00
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Stress-induced Phenomena in Metallization
by Zschech, Ehrenfried, Maex, ...
ISBN: 9780735403109
List Price: $148.00
5.
Stress-Induced Phenomena in Metallization Third International Workshop
by Ho, Paul S., Bravman, John,...
ISBN: 9781563964398
List Price: $140.00
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Stress-Induced Phenomena in Metallization Second International Workshop Austin, Tx March 1993
by Ho, Paul S., Li, Che-Yu, Tu...
ISBN: 9781563962516
List Price: $120.00
7.
Stress-induced Phenomena In Metallization Seventh International Workshop On Stress-induced P...
by Ho, Paul S., Baker, Sheffor...
ISBN: 9780735402256
List Price: $136.00
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9.
Electronic Packaging Materials Science V: Volume 203
by Lillie, Edwin D., Ho, Paul ...
ISBN: 9781107409996
List Price: $35.00
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Materials Reliability Issues in Microelectronics: Volume 225
by Lloyd, James R., Yost, Fred...
ISBN: 9781107409873
List Price: $35.00
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Advanced Interconnects for ULSI Technology
by Baklanov, Mikhail, Ho, Paul...
ISBN: 9781119963677
List Price: $205.00